Solo autori OAB
La lista e` ordinata per I.F. in senso decrescente.
Documenti in archivio:
1
- Autore: Cotroneo, V
1/1 pag.
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Totals
- ∑Authors OAB/Tot.: 3 / 5
- Percentage OAB_Authors: 60%
- ∑citations: 0
- ∑I.F.: 0
- ∑ I.F. / n. publications: 0
7. TECHNICAL REPORTS
Silicon mirrors for the XEUS X-ray telescope pore optics:
microroughness characterization
Spiga, D. , Sironi, G. , Cotroneo, V. , Canestrari, R., Destefanis, G.
2008, INAF/OAB Technical report 01/2008